Source and body contact structure for trench-DMOS devices using polysilicon

ABSTRACT

A semiconductor device includes a gate electrode, a top source region disposed next to the gate electrode, a drain region disposed below the bottom of the gate electrode, a oxide disposed on top of the source region and the gate electrode, and a doped polysilicon spacer disposed along a sidewall of the source region and a sidewall of the oxide. Methods for manufacturing such device are also disclosed. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.

PRIORITY CLAIM

This application is a divisional of and claims the priority benefit ofU.S. patent application Ser. No. 12/060,096, filed Mar. 31, 2008, theentire contents of which are incorporated herein by reference.

This application is a divisional of and claims the priority benefit ofco-pending U.S. patent application Ser. No. 13/559,490, filed Jul. 26,2012, the entire contents of which are incorporated herein by reference.

FIELD OF THE INVENTION

This invention generally relates to vertical power MOSFET devices andmore particularly to power MOSFET devices having improved source andbody contact structure for highest-performance.

BACKGROUND OF THE INVENTION

Conventionally, a power metal oxide silicon field effect transistor(power MOSFET) is used to provide high voltage circuits for powerintegrated circuit applications. Various internal parasitic componentsoften impose design and performance limitations on a conventional powerMOSFET. Among these parasitic components in a MOSFET transistor, specialcare must be taken in dealing with a parasitic npn bipolar junctiontransistor (BJT) formed between the source, the body, and the drain of aMOSFET device. The parasitic current, which flows from the source to thedrain and through the body as opposed to a channel, tends to run away,i.e., the more current, the more the bipolar action turns on. For thepurpose of reducing parasitic bipolar structure action and improving thedevice ruggedness, the base resistance of the body or drain to sourceon-resistance (Ra_(ds-on)) needs to be minimized. Standard solution isto dope the body as much as possible to reduce base resistance, whichreduces current gain of bipolar and forces to push more parasiticcurrent before bipolar turns on since base-emitter voltage V_(BE) is afunction of resistance:V _(BE) =I _(parasitic) ×R _(base-local)

For typical BJT devices, V_(BE) is about 0.5V to 0.6V to turn on thebipolar action.

U.S. Pat. No. 5,930,630 discloses a butted trench-contact MOSFET cellstructure having a self aligned deep and shallow high-concentrationbody-dopant regions. A top portion of a lightly doped source region isremoved to reduce contact resistance. However, horizontal buttedcontacts require a lot of space which adversely impacts both celldensity and R_(ds-on). In addition, the trench-contacts can have a highsource resistance since a small portion of the N+ source (for NMOS) iscontacted by the source metal. Also, for the trench-contact, if theBoron (for NMOS) body contact implant at the bottom of the trench is notvertical, there can be compensation of the N+ source (for NMOS) whichresults in excessive R_(ds-on) because of increased source resistance.

U.S. Pat. No. 5,684,319 discloses a DMOS device structure, and method ofmanufacturing the same features a self-aligned source and body contactstructure which requires no additional masks. N+ polysilicon spacers areused to form the source region at the periphery of the gate polysilicon.However, the N+ polysilicon source only improves the source contact,which lowers the resistance, but it has no effect on body region.

It would be desirable to develop a structure which achieves self-alignedsource/body contact without using mask, highly rugged and robuststructure with low-resistance source and body contact. It would befurther desirable to develop a structure which achieves low-thermalbudget to realize shallow junctions, compatible with stripe andclosed-cell geometries, compatible with standard foundry process, withstandard metallization schemes to achieve low contact resistivity,compatible with ultra-small cell-pitch. It would be further desirable toproduce a device with a low-cost of manufacture.

It is within this context that embodiments of the present inventionarise.

BRIEF DESCRIPTION OF THE DRAWINGS

Objects and advantages of the invention will become apparent uponreading the following detailed description and upon reference to theaccompanying drawings in which:

FIGS. 1A-1E are cross-sectional views of MOSFETs according to anembodiment of the present invention.

FIGS. 2A-2E are cross-sectional views of the alternative MOSFETsaccording to another embodiment of the present invention

FIGS. 3A-3D are cross-sectional views of the alternative MOSFETsaccording to another embodiment of the present invention.

FIGS. 4A-4M are cross-sectional views illustrating a method formanufacturing the MOSFETs of the types depicted in FIGS. 1A-1B.

FIGS. 5A-5E are cross-sectional views illustrating a method formanufacturing the MOSFETs of the types depicted in FIGS. 1C-1D.

FIGS. 6A-6M are cross-sectional views illustrating a method formanufacturing the MOSFETs of the types depicted in FIG. 1E.

DESCRIPTION OF THE SPECIFIC EMBODIMENTS

Although the following detailed description contains many specificdetails for the purposes of illustration, anyone of ordinary skill inthe art will appreciate that many variations and alterations to thefollowing details are within the scope of the invention. Accordingly,the exemplary embodiments of the invention described below are set forthwithout any loss of generality to, and without imposing limitationsupon, the claimed invention.

FIG. 1A is a cross-sectional view of a trench MOSFET 100 according to anembodiment of the present invention. The trench MOSFET 100 includes aP-body layer 112 formed on an N-epitaxial (epi) layer 116, a N+ polytrenched gate 110 formed in a trench in the P-body layer 112 and theN-epi layer 116, a top N+ source region 114 disposed on the P-body layer112 next to the trenched gate 110, and a drain region formed by asubstrate 117 disposed below the bottom of the trenched gate 110 andbelow the P-body layer 112. The trench MOSFET 100 also includes a gateoxide 111 disposed between the trenched gate 110 and the top N+ sourceregion 114, P-body layer 112 and the N-epi layer 116. A reflowed oxide108 is disposed on top of the N+ source region 114 and the trenched gate110. A doped N+ polysilicon spacer 106 is disposed along a sidewall ofthe source region 114 and a sidewall of the reflowed oxide 108. Thetrench MOSFET 100 may further include a barrier metal 104 disposed ontop of the P-body layer, the doped N+ polysilicon spacer 106 and thereflowed oxide 108 and a reflowed source metal 102 to fill contacts.

The N+ doped polysilicon spacer 106 increases N+ source contact area atthe sidewall of the top N+ source region 114 and spaces a heavily P-typeimplanted contact region 115 formed in the P-body layer 112 away fromthe top N+ source region 114, and hence away from a channel region 118formed on the sidewalls of the gate trenches in the body layer 112, tominimize any impact on the threshold voltage of the transistor.

The heavily implanted contact region 115 may be formed, e.g., using ashallow implant of the same conductivity type as the body layer 112, Theimplant may be done after etching the poly-Si spacers 106 and beforemetallization. The contact region 115 helps to reduce the body contactresistance. The benefits of spacing the heavily doped P+ body contactregion 115 away from the source 114 is really to space the P+ bodycontact region 115 away from the channel region 118, to ensure that theextra doping does not get close to trench sidewall regions. Any dopantdiffusion which reaches the trench sidewall surfaces might result in anincrease in the threshold voltage which is detrimental to theperformance.

FIG. 1B is a cross-sectional of an alternative trench MOSFET 101, whichhas a similar structure as the trench MOSFET 100. As shown in FIG. 1B,the N+ polysilicon spacer 107 is formed on a shelf on a portion of a topsurface of the source region 114 that is not covered by the oxide 108.This particular configuration of the N+ polysilicon spacer 107 furtherreduces contact resistance by exposing more of the source region 114 tocontact with the spacer 107.

FIG. 1C is a cross-sectional of an alternative trench MOSFET 103, whichhas similar structure as the trench MOSFET 100. As shown in FIG. 1C, aportion of a top surface of the P-body layer 112, which is notunderlying the source region 114, is recessed to a lower level than aportion of the top surface of the P-body layer 112 underlying the sourceregion 114. Among the benefits of this configuration compared to theforegoing embodiments is that the body contact region 115 can be furtherrecessed below the silicon surface, below the bottom of the source 114,which further reduces both body resistance and parasitic bipolar action.

FIG. 1D is a cross-sectional of an alternative trench MOSFET 109, whichis a combination of trench MOSFETs 101 and 103. As shown in FIG. 1D, thetrench MOSFET 109 includes a N+ polysilicon spacer 107 is formed on ashelf on a portion of a top surface of the source region 114 that is notcovered by the oxide 108 and a portion of a top surface of the P-bodylayer 112 that does not underlie the source region 114 is recessed to alower level than a portion of the top surface of the P-body layer 112underlying the source region 114. This configuration has the advantagesof lower source resistance by increasing the amount of N+ silicon incontact with the N+ polysilicon sidewall extension, and furtherrecessing of the Body contact region 115 below the silicon surface andbelow the source 114, to further reduce any parasitic bipolar action.

The N+ doped polysilicon spacer 107 allows different types of doping tobe done in the top source region. FIG. 1E is a cross-sectional of analternative trench MOSFET 111, which has a similar structure as thetrench MOSFET 100. As shown in FIG. 1E, trench MOSFET 111 includes aP-body layer 112 formed on an N-epitaxial (epi) layer 116, a N+ polytrenched gate 110 formed in a trench in the P-body layer 112 and theN-epi layer 116, a top N− source region 114 disposed on the P-body layer112 next to the trenched gate 110, and a drain region formed by asubstrate 117 disposed below the bottom of the trenched gate 110 andbelow the P-body layer 112. The highly N+ doped polysilicon spacer 106contacting the sidewall of the top low doped N− source region 114 addssmall resistance to control gain of the circuit to give more uniformitywhen the trench MOSFETs are connected in parallel.

FIG. 2A is a cross-sectional view of an N-channel trench MOSFET 200according to another embodiment of the present invention. A P-Channelstructure would be similar except for the conductivity type of thevarious doped regions (N become P and P become N, for a P-channelversion). In this embodiment, the trench MOSFET 200 includes a P-bodylayer 212 formed on an N-epitaxial (epi) layer 216, a N+ polysiliconfilled trenched gate 210 electrode formed in the P-body layer 212 andthe N-epi layer 216, a top N+ source region 214 disposed on the P-bodylayer 212 next to the trenched gate 210, and a drain region formed by asubstrate 217 disposed below the bottom of the trenched gate 210 andP-body layer 212. The trench MOSFET 200 also includes a gate oxide 211disposed between the N+ doped Polysilicon of the trenched gate 210 andthe top N+ source region 214, the P-body layer 212 and the N-epi layer216, a vertically etched oxide 208 disposed on top of the N+ sourceregion 214 and the trenched gate 210, and a doped N+ polysilicon spacer206 disposed along the sidewall of the source region and a sidewall ofthe vertically etched oxide 208. The trench MOSFET 200 further includesa barrier metal 204 disposed on top of the doped N+ polysilicon spacer206 and the vertically etched oxide 208, a Tungsten plug 218 adjacent tothe barrier metal 204 and a source metal 202 disposed on top of thebarrier metal 204 and the Tungsten plug 218.

A heavily P-type implanted contact region 215 may be formed in theP-body layer 212 proximate the spacer 206 and spaced away from the topN+ source region 214, and hence away from a channel region 219 formed onthe sidewalls of the gate trenches in the body layer 212, to minimizeany impact on the threshold voltage of the transistor by the bodycontact implant(s).

FIG. 2B is a cross-sectional of an alternative trench MOSFET 201, whichhas a similar structure as the trench MOSFET 200. As shown in FIG. 2B,the N+ polysilicon spacer 207 is formed on a shelf on a portion of a topsurface of the source region 214 that is not cover by the oxide 208. TheN+ polysilicon spacer 207 reduces more contact resistance by exposingmore of the source region 214.

FIG. 2C is a cross-sectional of an alternative trench MOSFET 203, whichhas similar structure as the trench MOSFET 200. As shown in FIG. 2C, aportion of a top surface of the P-body layer 212, which is notunderlying the source region 214, is recessed to a lower level than aportion of the top surface of the P-body layer 212 underlying the sourceregion 214.

FIG. 2D is a cross-sectional of an alternative trench MOSFET 209, whichis a combination of trench MOSFETs 201 and 203. As shown in FIG. 2D, thetrench MOSFET 209 includes a N+ polysilicon spacer 207 is formed on ashelf on a portion of a top surface of the source region 214 that is notcovered by the oxide 208 and a portion of a top surface of the P-bodylayer 212, which is not underlying the source region 214, is recessed toa lower level than a portion of the top surface of the P-body layer 212underlying the source region 214.

FIG. 2E is a cross-sectional of an alternative trench MOSFET 211, whichhas a similar structure as the trench MOSFET 200. As shown in FIG. 2E,trench MOSFET 211 includes a P-body layer 212 formed on an N-epitaxial(epi) layer 216, a N+ polysilicon filled trenched gate electrode 210formed in the P-body layer 212 and the N-epi layer 216, a top N− sourceregion 214 disposed on the P-body layer 212 next to the trenched gate210, and a drain region formed by a substrate 217 disposed below thebottom of the trenched gate 210 and the P-body layer 212. The highly N+doped polysilicon spacer 206 contacts a sidewall of a top low doped N−source region 214, which adds a small resistance to control gain of thecircuit to give more uniformity when the trench MOSFETs are connected inparallel. This is referred to as source ballasting, and results in amore robust transistors in high-power applications.

FIG. 3A is a cross-sectional view of a trench MOSFET 300 according toanother embodiment of the present invention. The trench MOSFET 300includes a P-body layer 312 formed on an N-epitaxial (epi) layer 316, aN+ polysilicon gate electrode 310 formed in a trench in the P-body layer312 and the N-epi layer 316, a top N+ source region 314 disposed on theP-body layer 312 next to the trenched gate 310, and a drain regionformed by a substrate 309 disposed below the bottom of the trenched gate310 and the P-body layer 312. The trench MOSFET 300 also includes a gateoxide 311 disposed between the trenched gate 310 and the top N+ sourceregion 314, P-body layer 312 and the N-epi layer 316. A verticallyetched oxide 308 is disposed on top of the N+ source region 314 and thetrenched gate 310, and a doped N+ polysilicon spacer 306 is disposedalong the sidewall of the source region and a sidewall of the verticallyetched oxide 308. The doped N+ polysilicon spacer 306 extends over astep formed in a top portion of the N+ source region 314.

A heavily P-type implanted contact region 315 may be formed in theP-body layer 312 proximate the spacer 306 and spaced away from the topN+ source region 314, and hence away from a channel region 319 formed onthe sidewalls of the gate trenches in the body layer 312, to minimizeany impact on the threshold voltage of the transistor.

The trench MOSFET 300 further includes a barrier metal 304 disposed ontop of the doped N+ polysilicon spacer 306 and the vertically etchedoxide 308, a Tungsten plug 318 adjacent to the barrier metal 304 and asource metal 302 disposed on top of the barrier metal 304 and theTungsten plug 318.

A configuration of the type shown in FIG. 3A has the additional benefitsthat the contact between the N+ source silicon region 314 and the N+doped Polysilicon spacer may be increased by forming a step in the N+silicon source region 414, which can further reduce the source contactresistance. With a step, the N+ silicon source region 314 may becontacted on a horizontal plane as well as two vertical sidewalls. Itshould be noted that this “partial step” into the N+ source 314 may beachieved simply by controlling an amount of over-etch into the siliconof the source region during the contact etch step.

FIG. 3B is a cross-sectional of an alternative trench MOSFET 301, whichhas a similar structure as the trench MOSFET 300. As shown in FIG. 3B,the N+ polysilicon spacer 307 is formed on a shelf on a portion of a topsurface of the source region 314 that is not covered by the oxide 308.The N+ polysilicon spacer 307 improves contact with the N+ source region314.

FIG. 3C is a cross-sectional of an alternative trench MOSFET 303, whichhas similar structure as the trench MOSFET 300. As shown in FIG. 3C, aportion of a top surface of the P-body layer 312 that does not underliethe source region 314 is recessed to a lower level than a portion of thetop surface of the P-body layer 312 underlying the source region 314.

FIG. 3D is a cross-sectional of an alternative trench MOSFET 309, whichis a combination of trench MOSFETs 301 and 303. As shown in FIG. 3D, thetrench MOSFET 309 includes a N+ polysilicon spacer 307 is formed on ashelf on a portion of a top surface of the source region 314 that is notcover by the oxide 308. A portion of a top surface of the P-body layer312 that does not underlie the source region 314 is recessed to a lowerlevel than a portion of the top surface of the P-body layer 312underlying the source region 314.

There are a number of different techniques for fabricating MOSFETdevices of the types described above. By way of example, FIGS. 4A-4M arecross-sectional views illustrating a method of fabrication of trenchMOSFET of the types depicted in FIGS. 1A-1B. As shown in FIG. 4A, anN-type epitaxial semiconductor layer 402 may be grown on a substrate 409(typically highly doped N+ for an N-channel device). A trench mask 404is then formed on a surface of the N-epi layer 402, e.g., by patterninga photoresist layer, or by patterning a hardmask oxide formed using alow temperature oxide (LTO) deposition technique or thermal oxidation,etched by a photoresist mask.

As shown in FIG. 4B, a trench 406 is then formed by reactive ion etching(RIE) the N-epi silicon layer through the trench mask 404 to apredetermined depth. Etched polymer may then be stripped and wafercleaned at this point. As shown in FIG. 4C, a thin gate oxide 408 isformed on the sidewall and bottom of the trench 406, e.g., using thermaloxidation, following standard sacrificial oxidation and sacrificialoxide removal. A conductive material, such as N+ doped polysilicon, isdeposited into the remaining space in the trench 406 and etched backusing standard techniques, until the oxide surfaces on top of region402, are exposed. The conductive material in the trench 406 is thenfurther etched back to a level below the top surface of the N-epi layer402 as shown in FIG. 4D.

As shown in FIG. 4E, the trench mask 404 is stripped away and an oxide412 is formed on top of the gate electrode, and an oxide 413 is formedover any exposed silicon surfaces. The two oxides are not identical eventhough they are formed at the same step, because of the differences indoping concentration of the two regions. A body region 414 is formed byion implantation (e.g., Boron ions at an energy of 20 to 100 KeV, and adose of 3×10¹² to 1×10¹⁴) and diffusion (e.g., at 950 C to 1100 C) inthe top portion of the N-epi layer 402 as shown in FIG. 4F. Then, N-typedopants are blanket implanted (shallow arsenic implant for example, doseof 2×10¹⁵ to 5×10¹⁵, energy of 40 to 80 KeV) and diffused (e.g., at 850C to 1000 C) in a top region of the P-Body region 414, thereby forming ashallow N+ source layer 416 as shown in FIG. 4G.

An oxide 418, such as boro-phospho-silicate glass (BPSG), is formed ontop of the gate 410 and the source regions 416 following with thedensification and reflow (e.g., at 800 to 900 C) as shown in FIG. 4H.

A portion of the oxide 418 and the mask 415 are dielectric etched usinga contact mask, to expose selected portions of the source regions 416 asshown in FIG. 4I. The selected portions of the source silicon regionsnot covered by the oxide 418 are then etched down to remove the exposedN+ source region, down to the P-body layer 414 as shown in FIG. 4J.Optionally, a portion at the top surface not covered by the oxide 418,is also etched to a level below that of a bottom surface of the sourceregion 416, which is described in FIG. 5B below in an alternative methodof fabrication of trench MOSFET devices of the types depicted in FIGS.1C-1D.

An N+ doped polysilicon layer 420 is deposited on top and sidewall ofthe remaining portions of the source region 416 and on top of the P-bodylayer 414 and the oxide 418 as shown in FIG. 4K. The thin polysiliconlayer (e.g., about 300 A to 2000 A) can be in-situ doped N-type duringdeposition, or ion-implanted after deposition using either Arsenic orPhosphorus (at a dose of 1×10¹⁵ to 5×10¹⁵, energy 20 KeV to 60 KeV), ifthe Polysilicon layer was deposited undoped. The N+ doped polysiliconlayer 420 is the etched back to form N+ doped polysilicon spacer 420disposed only on the sidewalls of the source regions 416 and the oxide418 as shown in FIG. 4L. At this point, a high-dose low-energy bodycontact ion implant step (Boron or BF₂, 5×10¹⁴ to 2×10¹⁵ dose, energy of10 KeV to 60 KeV) followed by a short rapid thermal anneal (850 C to1000 C, 10 to 60 seconds) can be performed to reduce the contactresistance of the resulting exposed body contact region 417. The dopingof this region simply has to be lower than that of the N+ polysiliconspacer layer.

As shown in FIG. 4M, the semiconductor device is completed by depositinga barrier metal 422 (such as Ti, TiN, Ti/TiN, TiW, TiWN, thickness inthe 200 A to 1500 A range) on top of the P-body layer 414, the N+ dopedpolysilicon spacer 420 and the oxide 418 followed by the deposition andpatterning of a top metal layer (thick aluminum, or AlCu alloy, 0.5 to 4microns thick for example) 424. The wafers are then passivated, e.g.,with a layer of oxide, nitride, or oxynitride, which is not shown inFIG. 4M.

FIGS. 5A-5E are cross-sectional views illustrating an alternative methodof fabrication of a trench MOSFET of the types depicted in FIGS. 1C-1D.FIG. 5A is the same as FIG. 4I as described above. The process describedwith respect to FIGS. 4A-4I may be used to produce the structure shownin FIG. 5A. The selected portions of the source regions not covered bythe oxide 418 are then etched down to the P-body layer 414 and a portionat the top surface of the P-body layer 414 not covered by the oxide 418is also etched to a level slightly below that of a bottom surface of thesource region 416 as shown in FIG. 5B.

An N+ doped polysilicon layer 420 is deposited on top and sidewall ofthe remaining portions of the source region 416 and on top of the P-bodylayer 414 and the oxide 418 as shown in FIG. 5C. This polysilicon layer420 can be deposited in-situ N+ doped, or it can be implanted witharsenic or phosphorus, if it was deposited undoped. The N+ dopedpolysilicon layer 420 is the etched back to form N+ doped polysiliconspacer 420 disposed only on the sidewall of the source region 416 andthe oxide 418 as shown in FIG. 5D. In addition, after etch-back of thepolysilicon, heavily P-doped contact regions 417 may be implanted intothe P-body layer 414 proximate the N+ polysilicon spacers 420 but spacedaway from the source region 416. As shown in FIG. 5E, the semiconductordevice may be completed by depositing a barrier metal 422 on top of theP-body layer 414, the N+ doped polysilicon spacer 420 and the oxide 418followed by deposition and patterning of a thick metal 424 and apassivation layer, which is not shown in FIG. 5E.

FIGS. 6A-6M are cross-sectional views illustrating a method offabrication of a trench MOSFET of the type depicted in FIG. 1E. Thisembodiment features a lightly doped source ballasting region whichimproves the reliability under certain applications. As shown in FIG.6A, an N-type epitaxial semiconductor layer 602 may be grown on a highlydoped substrate 609. A trench mask 604 is then formed on a surface ofthe N-epi layer 602, e.g., by patterning a photoresist layer, or,optionally patterning a hardmask oxide formed by a low temperature oxide(LTO) deposition technique or thermal oxidation, defined by aphotoresist masking step followed by an oxide etch step.

As shown in FIG. 6B, a trench 606 is then formed by reactive ion etching(RIE) the N-epi layer through the trench mask 604 to a predetermineddepth. Etched polymer may then be stripped and wafer cleaned at thispoint. As shown in FIG. 6C, a thin gate oxide 608 is formed on thesidewall of the trench 606 following a standard sacrificial oxidationgrowth and strip process. A conductive material, such as N+ polysilicon,is deposited into the remaining space in the trench 606 to form astandard poly stick up gate 610. The conductive material in the trench606 is then etched back to expose the top of the oxide 604 as shown inFIG. 6C. The N+ gate electrode material is then further etched-back to alevel below the top surface of the N-epi layer 602 as shown in FIG. 6D.

As shown in FIG. 6E, the trench mask 604 (oxide) is stripped off and anoxide 612 is formed on top of the gate electrode 610 and and oxide 613is formed over the exposed silicon. A body region 614 is then formed inthe top region of N-epi layer 602, e.g., using ion implantation anddiffusion, as shown in FIG. 6F. Then, N-type dopants are blanketimplanted (phosphorus for example, at a dose of 1×10¹² to 5×10¹⁴, energyof 20 to 80 KeV) and diffused (900 C to 1050 C) in a top region ofP-body region 614, thereby forming low doped N− source layer 616 asshown in FIG. 6G.

An oxide 618, such as boro-phospho-silicate glass, is formed on top ofthe gate 610 and the low-doped N− source regions 616 followed by adensification and reflow as shown in FIG. 6H. A portion of the oxide 618is etched using a contact mask (not shown) such that a portion of thelow-doped N− source regions 616 are exposed, as shown in FIG. 6I. Theselected portions of the source silicon regions not covered by the oxide618 are then etched down to the P-body layer 614 as shown in FIG. 6J.Optionally, a portion at the top surface of the P-body layer not coveredby the oxide 618 is also etched to a level below that of a bottomsurface of the source region 616.

An N+ doped polysilicon layer 620 is deposited on top and sidewall ofthe remaining portions of the source region 616 and on top of the P-bodylayer 614 and the oxide 618 as shown in FIG. 6K. The Polysilicon can bedeposited in-situ N+ doped (for N-channel) or implanted N type (shallowArsenic or phosphorus for example) if the polysilicon is depositedundoped. The N+ doped polysilicon layer 620 is the etched back to formN+ doped polysilicon spacer 620 disposed only on the sidewall of thelow-doped N-source region 616 and the oxide 618 as shown in FIG. 6L. Inaddition, after etch-back of the polysilicon, heavily P-doped contactregions 617 may be implanted into the P-body layer 614 proximate the N+polysilicon spacers 620 but spaced away from the source region 616. Asshown in FIG. 6M, the semiconductor device is completed by depositing abarrier metal 622 on top of the P-body layer 614, the N+ dopedpolysilicon spacer 620 and the oxide 618 followed by thick metaldeposition and patterning 624, and passivation (not shown in FIG. 6M).

Embodiments of the present invention allow for the fabrication ofN-channel or P-channel devices with low contact resistance and parasiticbipolar action. It is noted that although the foregoing examples relateto N-channel devices and their fabrication, those of skill in the artwill recognize that the same teachings may be applied to P-channeldevices and their fabrication. Since semiconductor materials of oppositepolarity (e.g., P-type and N-type) differ primarily in the polarity ofthe dopants used, the above teachings may be applied to P-channeldevices by reversing the polarity of the semiconductor layers anddopants discussed above.

While the above is a complete description of the preferred embodiment ofthe present invention, it is possible to use various alternatives,modifications and equivalents. Therefore, the scope of the presentinvention should be determined not with reference to the abovedescription but should, instead, be determined with reference to theappended claims, along with their full scope of equivalents. Anyfeature, whether preferred or not, may be combined with any otherfeature, whether preferred or not. In the claims that follow, theindefinite article “A”, or “An” refers to a quantity of one or more ofthe item following the article, except where expressly stated otherwise.The appended claims are not to be interpreted as includingmeans-plus-function limitations, unless such a limitation is explicitlyrecited in a given claim using the phrase “means for.”

What is claimed is:
 1. A semiconductor device comprising: a body regionformed in an epitaxial layer; a gate electrode formed in a trench in thebody region and epitaxial layer; a source region disposed on the bodyregion next to the gate electrode; a gate oxide disposed between thegate electrode and the source region, the body region and the epitaxiallayer; a drain region formed by a substrate disposed below a bottom ofthe gate electrode and below the body region; an oxide disposed on topof the gate electrode and extending over a top portion of the sourceregion; a doped polysilicon spacer disposed along a sidewall of thesource region and a sidewall of the oxide; an exposed body contactregion in an upper portion of the body region, adjacent to the dopedpolysilicon spacer, wherein the exposed body contact region has a topsurface which is recessed below the bottom surface of the source regionand spaced away from the source region by the doped Polysilicon spacer;and a source metal layer disposed on the device such that the dopedpolysilicon spacer is in electrical contact with the source region andthe source metal layer.
 2. The semiconductor device of claim 1, whereina portion of a top surface of the body region not underlying the sourceregion is recessed to a lower level than a portion of the top surface ofthe body region underlying the source region.
 3. The semiconductordevice of claim 1, wherein the doped polysilicon spacer extends to a topportion of the source region.
 4. The semiconductor device of claim 1,wherein the semiconductor device is an N-channel device.